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Modeling Secondary Electron Imaging at Atomic Resolution Using a Focused Coherent Electron Probe

Published online by Cambridge University Press:  27 August 2014

L. J. Allen ,
H. G. Brown ,
A. J. D’ Alfonso ,
J. Ciston ,
Y. Lin  and
L. D. Marks
L. J. Allen
Affiliation:
School of Physics, University of Melbourne, Parkville, Victoria 3010, Australia
H. G. Brown
Affiliation:
School of Physics, University of Melbourne, Parkville, Victoria 3010, Australia
A. J. D’ Alfonso
Affiliation:
School of Physics, University of Melbourne, Parkville, Victoria 3010, Australia
J. Ciston
Affiliation:
National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, Berkeley,California 94720, USA
Y. Lin
Affiliation:
Department of Materials Science and Engineering, Northwestern University, 2220 Campus Drive, Evanston, Illinois 60208, USA
L. D. Marks
Affiliation:
Department of Materials Science and Engineering, Northwestern University, 2220 Campus Drive, Evanston, Illinois 60208, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 82 - 83
Copyright
Copyright © Microscopy Society of America 2014 

References

Zhu, Y, et al, Nat. Mater. 8 (2009) p. 808.Google Scholar
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This research was supported under Australian Research Council’s Discovery Projects funding scheme (Project No. DP110102228).Google Scholar