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Modeling Ion Beam Induced Secondary Electrons
Published online by Cambridge University Press: 23 September 2015
Abstract
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- Abstract
- Information
- Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1689 - 1690
- Copyright
- Copyright © Microscopy Society of America 2015
References
[1]
Ramachandra, R., Griffin, B. & Joy, D., "A model of secondary electron imaging in the helium ion scanning microscope. Ultramicroscopy vol. 109, May 2009.Google Scholar
[2]
Berger, J. S. C. M.J., Zucker, M.A. & Chang, J. (2011). Stopping-Power and Range Tables for Electrons, Protons, and Helium Ions. Available: http://www.nist.gov/pml/data/star/index.cfm.Google Scholar
[3]
Ziegler., J. F. (2013). PARTICLE INTERACTIONS WITH MATTER. Available: http://www.srim.org/.Google Scholar
[4] This works was partially supported by the Biochemistry and Cellular and Molecular Biology at The University of Tennessee..Google Scholar