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Modeling Ion Beam Induced Secondary Electrons

Published online by Cambridge University Press:  23 September 2015

U. Huh ,
V. Iberi ,
W. Cho ,
R. Ramachandra  and
D. C. Joy
U. Huh
Affiliation:
Biochemistry and Cellular and Molecular Biology, University of Tennessee, Knoxville, TN 37996
V. Iberi
Affiliation:
Biochemistry and Cellular and Molecular Biology, University of Tennessee, Knoxville, TN 37996
W. Cho
Affiliation:
Electrical and Computer Engineering, University of Tennessee, Knoxville, TN 37996
R. Ramachandra
Affiliation:
National Center for Microscopy and Imaging Research, University of California San Diego, La Jolla, CA 92093
D. C. Joy
Affiliation:
Biochemistry and Cellular and Molecular Biology, University of Tennessee, Knoxville, TN 37996 Center for Nanophase Materials Science, Oak Ridge National Laboratory, Oak Ridge, TN 37831

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1689 - 1690
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Ramachandra, R., Griffin, B. & Joy, D., "A model of secondary electron imaging in the helium ion scanning microscope. Ultramicroscopy vol. 109, May 2009.Google Scholar
[2] Berger, J. S. C. M.J., Zucker, M.A. & Chang, J. (2011). Stopping-Power and Range Tables for Electrons, Protons, and Helium Ions. Available: http://www.nist.gov/pml/data/star/index.cfm.Google Scholar
[3] Ziegler., J. F. (2013). PARTICLE INTERACTIONS WITH MATTER. Available: http://www.srim.org/.Google Scholar
[4] This works was partially supported by the Biochemistry and Cellular and Molecular Biology at The University of Tennessee..Google Scholar