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Model-Based Super-Resolution of SEM Images of Nano-Materials

Published online by Cambridge University Press:  25 July 2016

Suhas Sreehari ,
S. V. Venkatakrishnan ,
Jeff Simmons ,
Lawrence Drummy  and
Charles A. Bouman
Suhas Sreehari
Affiliation:
Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA
S. V. Venkatakrishnan
Affiliation:
Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA, USA
Jeff Simmons
Affiliation:
Air Force Research Laboratory, Dayton, OH, USA
Lawrence Drummy
Affiliation:
Air Force Research Laboratory, Dayton, OH, USA
Charles A. Bouman
Affiliation:
Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 532 - 533
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Bouman, C. A. “Model based image processing.”.Google Scholar
[2] Park, S. C., Park, M. K. & Kang, M. G. “Super-resolution image reconstruction: a technical overview,”. Signal Processing Magazine, IEEE 20 3, pp. 21–36, 2003.Google Scholar
[3] Sreehari, S., Venkatakrishnan, S., Wohlberg, B., Drummy, L. F., Simmons, J. P. & Bouman, C. A. “Plug-and-play priors for bright field electron tomography and sparse interpolation,”. arXiv preprint arXiv:1512.07331 (2015).Google Scholar
[4] Gabay, D. & Mercier, B. “A dual algorithm for the solution of nonlinear variational problems via finite element approxi- mation,”. Computers & Mathematics with Applications 2 1, pp. 17–40, 1976.Google Scholar
[5] This work was supported by AFOSR/MURI grant #FA9550-12-1-0458, by UES Inc.Google Scholar