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Model-Based EELS Quantification and ELNES Phase Mapping Using Experimentally Measured Cross-Sections

Published online by Cambridge University Press:  05 August 2019

Bernhard Schaffer ,
Liam Spillane  and
Paul J. Thomas
Bernhard Schaffer
Affiliation:
Gatan Inc., Pleasanton, CA, USA
Liam Spillane
Affiliation:
Gatan Inc., Pleasanton, CA, USA
Paul J. Thomas*
Affiliation:
Gatan Inc., Pleasanton, CA, USA
*
*Corresponding author: [email protected]

Abstract

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Type
Current Trends and Challenges in Electron Energy-Loss Spectroscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 648 - 649
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Verbeeck, J et al. , Ultramicroscopy 106 (2006), p. 11.Google Scholar
[2]Thomas, PJ et al. , Microsc. Microanal. 18 (S2) (2012), p. 968.Google Scholar
[3]Riegler, K et al. , Ultramicroscopy 110 (2010), p. 8.Google Scholar