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Misorientation Mapping for Visualization of Plastic Deformation via Electron Back-Scattered Diffraction

Published online by Cambridge University Press:  24 January 2006

L.N. Brewer ,
M.A. Othon ,
L.M. Young  and
T.M. Angeliu
L.N. Brewer
Affiliation:
General Electric Global Research Center, One Research Circle, Niskayuna, NY 12309, USA L.N. Brewer is now at Sandia National Laboratories, Albuquerque, New Mexico
M.A. Othon
Affiliation:
General Electric Global Research Center, One Research Circle, Niskayuna, NY 12309, USA
L.M. Young
Affiliation:
General Electric Global Research Center, One Research Circle, Niskayuna, NY 12309, USA
T.M. Angeliu
Affiliation:
General Electric Global Research Center, One Research Circle, Niskayuna, NY 12309, USA
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Abstract

The ability to map plastic deformation around high strain gradient microstructural features is central in studying phenomena such as fatigue and stress corrosion cracking. A method for the visualization of plastic deformation in electron back-scattered diffraction (EBSD) data has been developed and is described in this article. This technique is based on mapping the intragrain misorientation in polycrystalline metals. The algorithm maps the scalar misorientation between a local minimum misorientation reference pixel and every other pixel within an individual grain. A map around the corner of a Vickers indentation in 304 stainless steel was used as a test case. Several algorithms for EBSD mapping were then applied to the deformation distributions around air fatigue and stress corrosion cracks in 304 stainless steel. Using this technique, clear visualization of a deformation zone around high strain gradient microstructural features (crack tips, indentations, etc.) is possible with standard EBSD data.

Keywords

EBSDplasticityfractureelectron diffractionmisorientation
Type
MICROANALYSIS
Information
Microscopy and Microanalysis , Volume 12 , Issue 1 , February 2006 , pp. 85 - 91
Copyright
2006 Microscopy Society of America

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