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Misfit Dislocations in Ferroelectric Thin films

Published online by Cambridge University Press:  03 August 2008

M Arredondo ,
M Chi ,
M Saunders ,
A Petraru ,
V Nagarajan ,
H Kohlstedt  and
ND Browning
M Arredondo
Affiliation:
University of New South Wales, Australia
M Chi
Affiliation:
University of California, Davis
M Saunders
Affiliation:
University of Western Australia
A Petraru
Affiliation:
Institut für Festkörperforschung, Germany
V Nagarajan
Affiliation:
University of New South Wales, Australia
H Kohlstedt
Affiliation:
Institut für Festkörperforschung, Germany
ND Browning
Affiliation:
University of California, Davis
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 240 - 241
Copyright
© 2008 Microscopy Society of America

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