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Migrating Interfaces in Sapphire Bicrystals and Tricrystals

Published online by Cambridge University Press:  02 July 2020

N. Ravishankar ,
M.T. Johnson  and
C. Barry Carter
N. Ravishankar
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota421 Washington Ave. SE, Minneapolis, MN55455-01432
M.T. Johnson
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota421 Washington Ave. SE, Minneapolis, MN55455-01432
C. Barry Carter
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota421 Washington Ave. SE, Minneapolis, MN55455-01432
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Extract

The migration of grain boundaries in polycrystalline materials can occur under a variety of driving forces. Grain growth in a single-phase material and Ostwald ripening of a second phase are two common processes involving boundary migration. The mass transport in each of these cases can be related to a chemical potential difference across the grains; due to curvature in the former case and due to a difference in the chemistry in the latter case. The mass transport across grains controls the densification process during sintering. In the case of liquid-phase sintering (LPS), a liquid film may be present at the grain boundaries which results in an enhanced mass transport between grains leading to faster densification. Hence, in LPS, it is important to understand mass transport across and along a boundary containing a liquid film. The use of bicrystals and tricrystals with glass layers in the boundary can provide a controlled geometry by which to study this phenomenon.

Type
Ceramics & Minerals
Information
Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 386 - 387
Copyright
Copyright © Microscopy Society of America

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References

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