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Microstructure of Plasma-Nitrided 316 Austenitic Stainless Steel

Published online by Cambridge University Press:  02 July 2020

J.C. Jiang  and
E.I. Meletis
J.C. Jiang
Affiliation:
Louisiana State University, Mechanical Engineering Department, Materials Science and Engineering Program, Baton Rouge, LA, 70803
E.I. Meletis
Affiliation:
Louisiana State University, Mechanical Engineering Department, Materials Science and Engineering Program, Baton Rouge, LA, 70803
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Austenitic stainless steels plasma-nitrided at low temperature can have a tremendously improved surface hardness without affecting their excellent corrosion resistance. The surface layer of these nitrided materials was considered to be composed of an uncharacterized, so called “S-phase”. During the past decade, several research groups have studied “S” phase using X-ray diffraction and transmission electron microscopy (TEM), but its microstructure is not yet well understood and is still a topic of debate. In this paper, we characterize the microstructure of 316 stainless steel nitrided by intensified plasma-assisted processing (IPAP) using cross-sectional TEM.

Samples of 316 austenitic stainless steel were nitrided for 1 hour by IPAP at a temperature of ∼ 400 °C. Plasma-nitrided samples were cross-sectioned and glued face-to-face by joining the nitrided surface. Crosssectional specimens for TEM observations were prepared by mechanical grinding, polishing and dimpling followed by Ar+ milling. TEM studies were carried out in a newly installed JEOL JEM 2010 electron microscope in the Materials Characterization Facility at the Louisiana State University.

Type
Films and Coatings
Information
Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 450 - 451
Copyright
Copyright © Microscopy Society of America

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References

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