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Microstructure evolution of a Cu and θ-AI2O3 composite observed by aberration corrected HAADF-STEM

Published online by Cambridge University Press:  23 September 2015

Zhiyang Yu ,
Michael Kracum ,
Animesh Kundu ,
Helen M. Chan  and
Martin P. Harmer
Zhiyang Yu
Affiliation:
Center for Advanced Materials and Nanotechnology, Department of Materials Science and Engineering, Lehigh University, Bethlehem, PA, 18015
Michael Kracum
Affiliation:
Center for Advanced Materials and Nanotechnology, Department of Materials Science and Engineering, Lehigh University, Bethlehem, PA, 18015
Animesh Kundu
Affiliation:
Center for Advanced Materials and Nanotechnology, Department of Materials Science and Engineering, Lehigh University, Bethlehem, PA, 18015
Helen M. Chan
Affiliation:
Center for Advanced Materials and Nanotechnology, Department of Materials Science and Engineering, Lehigh University, Bethlehem, PA, 18015
Martin P. Harmer
Affiliation:
Center for Advanced Materials and Nanotechnology, Department of Materials Science and Engineering, Lehigh University, Bethlehem, PA, 18015

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1351 - 1352
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Hiroshi, K., Yasukawa, M., Hyodo, H., Kurita, M., Yanagi, H. & Hosono, H., Nature 389 (1997). p 939.Google Scholar
[2] Byrne, D., Cowley, A., McNally, P. & McGlinn, E., Crystal Engineering Communication 15 (2013). p 6144.Google Scholar
[3] Kracum, M., Kundu, A., Harmer, M.P. & Chan, H.M., Journal of Material Science 50 (2015). p 1818.CrossRefGoogle Scholar
[4] Meagen, M., Ashmore, N. & Cann, D., Thin Solid Films 496 (2006). p 146.Google Scholar
[5] The authors acknowledge funding support from ONR-MURI, Grant N00014-11-1-0678, monitored by Dr. D. Shifler..Google Scholar