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Microstructural Characterization of Sputter Deposited BaTiO3/Ni/BaTiO3/Ni/BaTiO3 Multi-layer Thin Films on SiO2/Si Wafers

Published online by Cambridge University Press:  26 July 2009

M Zhang ,
JN Reck ,
FS Miller  and
MJ O'Keefe
M Zhang
Affiliation:
Missouri University of Science and Technology
JN Reck
Affiliation:
Missouri University of Science and Technology
FS Miller
Affiliation:
Missouri University of Science and Technology
MJ O'Keefe
Affiliation:
Missouri University of Science and Technology

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 1224 - 1225
Copyright
Copyright © Microscopy Society of America 2009