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Micromechanical Behavior of Silicate Glass Films on Alumina Substrates

Published online by Cambridge University Press:  02 July 2020

A. V. Zagrebelny  and
C. B. Carter
A. V. Zagrebelny
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, 421 Washington Ave.SE, Minneapolis, MN, 55455-0132
C. B. Carter
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, 421 Washington Ave.SE, Minneapolis, MN, 55455-0132
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Extract

In polycrystalline liquid-phase sintered (LPS) alumina ceramics, intergranular phases have proved to have a profound effect on mechanical properties such as strength, toughness, plastic deformation, and high-temperature creep. The presence of such intergranular phases, can also influence the kinetics of many processes including sintering, grain growth, and phase transformations. As a result, the key to optimizing the performance of a ceramic material is frequently related to optimizing the properties of these grain boundary regions. In order to understand the interactions between the glass layer and the crystalline grains at a fundamental level, the amorphous material must be placed in contact with the crystalline ceramic as a thin film in a controlled manner. Preparation of such a glass phase in the thin-film geometry has also prompted the use of nontraditional mechanicaltesting techniques.

In the present study, interfaces between silicate glass and single-crystal α-Al2O3 have been studied using AFM and nanoindentation.

Type
Scanned Probe Microscopies: Technologies, Methodologies, and Applications
Information
Microscopy and Microanalysis , Volume 3 , Issue S2: Proceedings: Microscopy & Microanalysis '97, Microscopy Society of America 55th Annual Meeting, Microbeam Analysis Society 31st Annual Meeting, Histochemical Society 48th Annual Meeting, Cleveland, Ohio, August 10-14, 1997 , August 1997 , pp. 1269 - 1270
Copyright
Copyright © Microscopy Society of America 1997

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References

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6. Research is supported by the U. S. DoE under Grant No. DE-FG02-92ER45465. The AFM and Hysitron indenter are part of the University of Minnesota Characterization Facility supported in part by Center for Interfacial Engineering, an NSF Engineering Research Center.Google Scholar