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Microanalysis of Cd Whiskers on Cd Plated Long-Term Used Hardware

Published online by Cambridge University Press:  30 July 2021

Sara Dickens
Affiliation:
Sandia National Laboratories, Albuquerque, New Mexico, United States
Tim Ruggles
Affiliation:
Sandia National Laboratories, Albuquerque, New Mexico, United States
Rachel White
Affiliation:
Sandia National Laboratories, United States
Zahra Ghanbari
Affiliation:
Sandia National Laboratories, United States
Daniel Perry
Affiliation:
Sandia National Laboratories, United States
Donald Susan
Affiliation:
Sandia National Laboratories, United States

Abstract

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Type
Microscopy and Microanalysis for Real World Problem Solving
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Nanev, C. and Iwanov, D., Growth of Zinc and Cadmium Whiskers. Physica Status Solidi, 1967. 23: p. 663-673.CrossRefGoogle Scholar
Verma, A.R. and Peneva, S.K., X-ray Investigation on the Growth of Cd Whiskers. Journal of Crystal Growth, 1968. 3: p. 700-704.CrossRefGoogle Scholar
This paper describes objective technical results and analysis. Any subjective views or opinions that might be expressed in the paper do not necessarily represent the views of the U.S. Department of Energy or the United States Government. Sandia National Laboratories is a multimission laboratory managed and operated by National Technology and Engineering Solutions of Sandia, LLC., a wholly owned subsidiary of Honeywell International, Inc., for the U.S. Department of Energy's National Nuclear Security Administration under contract DE-NA-0003525Google Scholar
SAND2021-2100 CGoogle Scholar