Micro XRF Element Maps Are A New Method Of Detecting Elements At Lower Concentrations Than The Electron Beam Produced Corollary: A Garnet Schist Example

C Schwandt

doi:10.1017/S1431927609094914

Micro XRF Element Maps Are A New Method Of Detecting Elements At Lower Concentrations Than The Electron Beam Produced Corollary: A Garnet Schist Example

Published online by Cambridge University Press: 26 July 2009

C Schwandt

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C Schwandt*: Affiliation:
McCrone Associates

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type: Abstract
Information: Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 34 - 35

DOI: https://doi.org/10.1017/S1431927609094914 [Opens in a new window]

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Micro XRF Element Maps Are A New Method Of Detecting Elements At Lower Concentrations Than The Electron Beam Produced Corollary: A Garnet Schist Example

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