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Micro XRF Element Maps Are A New Method Of Detecting Elements At Lower Concentrations Than The Electron Beam Produced Corollary: A Garnet Schist Example

Published online by Cambridge University Press:  26 July 2009

C Schwandt
C Schwandt*
Affiliation:
McCrone Associates

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 34 - 35
Copyright
Copyright © Microscopy Society of America 2009