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Methods for Conducting Electron Backscattered Diffraction (EBSD) on Polycrystalline Organic Molecular Thin Films

Published online by Cambridge University Press:  21 June 2018

Kevin Abbasi Open the ORCID record for Kevin Abbasi [Opens in a new window] ,
Danqi Wang ,
Michael A. Fusella ,
Barry P. Rand  and
Amir Avishai
Kevin Abbasi*
Affiliation:
Swagelok Center for Surface Analysis of Materials, Case School of Engineering, Case Western Reserve University, Cleveland, OH 44106, USA
Danqi Wang
Affiliation:
Swagelok Center for Surface Analysis of Materials, Case School of Engineering, Case Western Reserve University, Cleveland, OH 44106, USA
Michael A. Fusella
Affiliation:
Department of Electrical Engineering, Princeton University, Princeton, NJ 08544, USA
Barry P. Rand
Affiliation:
Department of Electrical Engineering, Princeton University, Princeton, NJ 08544, USA Andlinger Center for Energy and the Environment, Princeton University, Princeton, NJ 08544, USA
Amir Avishai
Affiliation:
Swagelok Center for Surface Analysis of Materials, Case School of Engineering, Case Western Reserve University, Cleveland, OH 44106, USA
*
*Author for correspondence: Kevin Abbasi, E-mail: [email protected]
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Abstract

Electron backscattered diffraction (EBSD) is a technique regularly used to obtain crystallographic information from inorganic samples. When EBSD is acquired simultaneously with emitting diodes data, a sample can be thoroughly characterized both structurally and compositionally. For organic materials, coherent Kikuchi patterns do form when the electron beam interacts with crystalline material. However, such patterns tend to be weak due to the low average atomic number of organic materials. This is compounded by the fact that the patterns fade quickly and disappear completely once a critical electron dose is exceeded, inhibiting successful collection of EBSD maps from them. In this study, a new approach is presented that allows successful collection of EBSD maps from organic materials, here the extreme example of a hydrocarbon organic molecular thin film, and opens new avenues of characterization for crystalline organic materials.

Keywords

electron backscattered diffractionEBSDorientation mappingSEMorganic semiconductor thin film
Type
Biological Science Applications
Information
Microscopy and Microanalysis , Volume 24 , Issue 4 , August 2018 , pp. 420 - 423
Copyright
© Microscopy Society of America 2018 

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References

Avishai, A, Abbasi, K, Wang, D, Avishai, N, Wu, D, Bedekar, V, Hyde, S, Sitzman, S Heuer, A (2015) Tackling characterization challenges in high deformation/stress steel alloys using transmission Kikuchi diffraction (TKD). Microsc Microanal 21, 2377–2378.Google Scholar
Britton, TB, Jiang, J, Guo, Y, Vilalta-Clemente, A, Wallis, D, Hansen, LN, Winkelmann, A Wilkinson, AJ (2016) Tutorial: crystal orientations and EBSD – Or which way is up? Mater Charact 117, 113–126.Google Scholar
Fusella, MA, Schreiber, F, Abbasi, K, Kim, JJ, Briseno, AL Rand, BP (2017a) Homoepitaxy of crystalline rubrene thin films. Nano Lett 17, 3040–3046.Google Scholar
Fusella, MA, Yang, S, Abbasi, K, Choi, HH, Yao, Z, Podzorov, V, Avishai, A Rand, BP (2017b) Use of an underlayer for large area crystallization of rubrene thin films. Chem Mater 29, 6666–6673.Google Scholar
Henn, DE, Williams, WG Gibbons, DJ (1971) Crystallographic data for an orthorhombic form of rubrene. J Appl Crystallogr 4, 256 .Google Scholar
Jurchescu, OD, Meetsma, A Palstra, TTM (2006) Low-temperature structure of rubrene single crystals grown by vapor transport. Acta Crystallogr B Struct Sci 62, 330–334.Google Scholar
Leijten, ZJWA, Keizer, ADA, de With, G Friedrich, H (2017) Quantitative analysis of electron beam damage in organic thin films. J Phys Chem C 121, 10552–10561.Google Scholar
Morgan, G London, D (1996) Optimizing the electron microprobe analysis of hydrous alkali aluminosilicate glasses. Am Mineral 81, 1176–1185.Google Scholar
Taylor, WH (1936) X-ray measurements on diflavylene, rubrene, and related compounds. Z Kristallog Cryst Mater 93, 151–155.Google Scholar
Weikusat, I, De Winter, DAM, Pennock, GM, Hayles, M, Schneijdenberg, CTWM Drury, MR (2011) Cryogenic EBSD on ice: Preserving a stable surface in a low pressure SEM. J Microsc 242, 295–310.Google Scholar