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Methods for Calibration of Specimen Temperature During In Situ Transmission Electron Microscopy Experiments

Published online by Cambridge University Press:  20 January 2020

Fabrizio Gaulandris
Affiliation:
Department of Energy Conversion and Storage, Technical University of Denmark, Fysikvej, DK-2800 Kgs. Lyngby, Denmak
Søren B. Simonsen*
Affiliation:
Department of Energy Conversion and Storage, Technical University of Denmark, Fysikvej, DK-2800 Kgs. Lyngby, Denmak
Jakob B. Wagner
Affiliation:
DTU Nanolab, Technical University of Denmark, Fysikvej DK-2800 Kgs. Lyngby, Denmark
Kristian Mølhave
Affiliation:
DTU Nanolab, Technical University of Denmark, Fysikvej DK-2800 Kgs. Lyngby, Denmark
Shun Muto
Affiliation:
Institute of Materials and Systems for Sustainability, Nagoya University, 464-8601 Furocho, Chikusa-ku, Nagoya, Aichi, Japan
Luise T. Kuhn
Affiliation:
Department of Energy Conversion and Storage, Technical University of Denmark, Fysikvej, DK-2800 Kgs. Lyngby, Denmak
*
*Author for correspondence: Søren B. Simonsen, E-mail: [email protected]
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Abstract

One of the biggest challenges for in situ heating transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) is the ability to measure the local temperature of the specimen accurately. Despite technological improvements in the construction of TEM/STEM heating holders, the problem of being able to measure the real sample temperature is still the subject of considerable discussion. In this study, we review the present literature on methodologies for temperature calibration. We analyze calibration methods that require the use of a thermometric material in addition to the specimen under study, as well as methods that can be performed directly on the specimen of interest without the need for a previous calibration. Finally, an overview of the most important characteristics of all the treated techniques, including temperature ranges and uncertainties, is provided in order to provide an accessory database to consult before an in situ TEM/STEM temperature calibration experiment.

Type
Materials Science Applications
Copyright
Copyright © Microscopy Society of America 2020

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