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A Method to Prepare TEM Specimens by Focused Ion Beam Milling for Cu/diamond Composites

Published online by Cambridge University Press:  01 August 2018

Luhua Wang ,
Hailong Zhang ,
Xitao Wang ,
Jinguo Wang  and
Moon J. Kim
Luhua Wang
Affiliation:
State Key Laboratory for Advanced Metals and Materials, University of Science and Technology Beijing, Beijing100083, China Department of Materials Science and Engineering, The University of Texas at Dallas, Richardson, Texas75080, USA
Hailong Zhang
Affiliation:
State Key Laboratory for Advanced Metals and Materials, University of Science and Technology Beijing, Beijing100083, China
Xitao Wang
Affiliation:
State Key Laboratory for Advanced Metals and Materials, University of Science and Technology Beijing, Beijing100083, China
Jinguo Wang
Affiliation:
Department of Materials Science and Engineering, The University of Texas at Dallas, Richardson, Texas75080, USA
Moon J. Kim
Affiliation:
Department of Materials Science and Engineering, The University of Texas at Dallas, Richardson, Texas75080, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 838 - 839
Copyright
© Microscopy Society of America 2018 

References

[1] Zweben, C J. Adv. Mater. 39 2007) p. 3.Google Scholar
[2] Schubert, T, et al., Compos. Part A: Appl. Sci. Manuf. 38 2007) p. 2398.Google Scholar
[3] Li, J W, et al., Scr. Mater. 109 2015) p. 72.Google Scholar
[4] Giannuzzi, L A, Geurts, R Ringnalda, J Microsc. Microanal. 11(suppl 2 2005) p. 828.Google Scholar
[5] The authors acknowledge fundings from the International Science and Technology Cooperation Program of China (No. 2014DFA51610) and the Louis Beecherl, Jr Endowment Funds.Google Scholar