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Metallographic Sectioning and Grinding Damage Analysis Through the Use of Color Metallography and Electron Backscatter Diffraction (EBSD)

Published online by Cambridge University Press:  26 July 2009

GM Lucas ,
GF Vander Voort ,
P Philippe ,
M Lagacé  and
P Hovington
GM Lucas
Affiliation:
Buehler Ltd
GF Vander Voort
Affiliation:
Buehler Ltd
P Philippe
Affiliation:
McGill University,Canada
M Lagacé
Affiliation:
Hydro-Quebec Research Institute,Canada
P Hovington
Affiliation:
Hydro-Quebec Research Institute,Canada

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 58 - 59
Copyright
Copyright © Microscopy Society of America 2009