Hostname: page-component-586b7cd67f-2plfb Total loading time: 0 Render date: 2024-11-26T13:21:22.287Z Has data issue: false hasContentIssue false
  • English
  • Français

Mephisto: A Novel Synchrotron Imaging Photoelectron Spectromicroscope

Published online by Cambridge University Press:  02 July 2020

Gelsomina De Stasio
Gelsomina De Stasio*
Affiliation:
Institut de Physique Appliquée, Ecole Polytechnique Fédérale, CH-1015, Lausanne, Switzerland, and Istituto di Struttura della Materia del CNR, Via Fosso del Cavaliere, 1-00133, Roma, Italy.
Get access

Extract

We discuss the scheme and test performances of the recently commissioned MEPHISTO system in its final configuration. The tests show that the improvements in the electron optics system with respect to other instruments in the same class made it possible to reach lateral resolutions in the 50 nm range. They also demonstrate rather good spectromicroscopy and spectroscopy performances, reliability and flexibility of operation.

This instrument belongs to the class of the electron-imaging systems, like the PEEM (PhotoElectron Emission Microscope) [1] and the X-PEEM (X-ray PhotoElectron Emission Microscope) Microscope [2-5], Our new instrument, called MEPHISTO from the French acronym “Microscope a Emission de Photo électrons par Illumination Synchrotronique de type Onduleur” (Photoelectron Emission Microscope by Synchrotron Undulator Illumination) shares the good characteristics of the instruments of its class: real-time chemical imaging, fast taking of local x-ray absorption spectra, high spatial resolution, large dynamic range, flexibility and user-friendliness.

Type
Novel X-Ray Methods: From Microscopy to Ultimate Detectability
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 358 - 359
Copyright
Copyright © Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Engel, W., Kordesh, M. E., Rotermund, H. H., Kubala, S., von Oertzen, A., Ultramicroscopy 36, 148 (1991).CrossRefGoogle Scholar
2.Tonner, B. P. and Harp, G. R., Rev. Sci. Instrum. 59, 853–858 (1988).CrossRefGoogle Scholar
3.Tonner, B. P. and Harp, G. R., J. Vac. Sci. Technol. 7, 1–4 (1989).CrossRefGoogle Scholar
4.Tonner, B. P. and Harp, G. R., Koranda, S. F., Zhang, J., Rev. Sci. Instrum. 63, 564–568 (1992).CrossRefGoogle Scholar
5.Stasio, Gelsomina De, Hardcastle, S., Koranda, S. F., Tonner, B. P., Mercanti, D., Ciotti, M. T., Perfetti, P. and Margaritondo, G., Phys. Rev. E47, 2117–2121 (1993).Google Scholar
6.Stasio, Gelsomina De, Lorusso, G. F.Droubay, T., Kohli, M., Muralt, P., Perfetti, P., Margaritondo, G.Kelly, T. F. and Tonner, B. P., Rev. Sci. Instrum. 67, 737–741 (1996).CrossRefGoogle Scholar