Hostname: page-component-586b7cd67f-2plfb Total loading time: 0 Render date: 2024-11-25T23:34:03.409Z Has data issue: false hasContentIssue false
  • English
  • Français

Measuring and Quantitatively Analyzing the Electrical Characteristics of Individual Semiconducting Nanowires in an Nanowire Array

Published online by Cambridge University Press:  03 August 2008

L-M Peng ,
Y Liu ,
S Wang ,
ZY Zhang  and
Q Li
L-M Peng
Affiliation:
Peking University, China
Y Liu
Affiliation:
Peking University, China
S Wang
Affiliation:
Peking University, China
ZY Zhang
Affiliation:
Peking University, China
Q Li
Affiliation:
Chinese University of Hong Kong, Hong Kong
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 4 - 5
Copyright
© 2008 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)