Hostname: page-component-7bb8b95d7b-5mhkq Total loading time: 0 Render date: 2024-09-15T08:14:32.194Z Has data issue: false hasContentIssue false

The Measurement Of Subtle Structural Changes In Yba2cu3O7-x By Processing High Resolution Tem Images

Published online by Cambridge University Press:  02 July 2020

J.C. Barry
Affiliation:
Centre for Microscopy and Microanalysis, The University of Queensland, QLD4072, Australia
J.A. Alarco
Affiliation:
Centre for Microscopy and Microanalysis, The University of Queensland, QLD4072, Australia Advanced Ceramics Development, Uniquest Ltd., The University of Queensland, QLD4072, Australia
Get access

Extract

Since the discovery of high temperature superconducting (HTS) ceramics there has been a great deal of discussion about theories of superconductivity. In a recent theory it has been proposed that the Tc's in these new materials are related in some way to a subtle phase separation in the structure. HTS ceramics have been studied quite intensively by high resolution transmission electron microscopy (HRTEM) and by electron diffraction (ED). In such studies the major focus invariably has been on the periodic structure of the object. However, early HRTEM work on Yba2cu3O7-x by Barry found that in addition to the crystalline order, the Yba2cu3O7-x HTS has a non-periodic structural modulation. In this work we have used an image processing method to look for subtle structural changes in Yba2cu3O7-x by measuring the bending of lattice fringes at twin planes. The image processing method is similar to the method used by Hetherington to study rigid body displacements at gold grain boundaries.

Type
High Resolution Electron Microscopy
Copyright
Copyright © Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Phillips, J.C., Physica C, 252 (1995) 188198.CrossRefGoogle Scholar
2.Barry, J.C., Jour. Electron Microsc. Tech., 8 (1988) 325337CrossRefGoogle Scholar
3.Hetherington, C.J.D. et al., Inst. Phys. Conf. Ser., 138 (1993) 255Google Scholar
4The authors would like to acknowledge the use of facilities at the Centre for Microscopy and Microanalysis, University of Queensland.Google Scholar