Hostname: page-component-cd9895bd7-dk4vv Total loading time: 0 Render date: 2024-12-23T00:47:51.866Z Has data issue: false hasContentIssue false
  • English
  • Français

Measurement of Polystyrene Mean Inner Potential by Transmission Electron Holography of Latex Spheres

Published online by Cambridge University Press:  28 July 2005

Y.C. Wang ,
T.M. Chou ,
M. Libera ,
E. Voelkl  and
B.G. Frost
Y.C. Wang
Affiliation:
Department of Materials Science and Engineering, Stevens Institute of Technology, Hoboken, NJ 07030 National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, University of California, Berkeley, CA 94720
T.M. Chou
Affiliation:
Department of Materials Science and Engineering, Stevens Institute of Technology, Hoboken, NJ 07030
M. Libera
Affiliation:
Department of Materials Science and Engineering, Stevens Institute of Technology, Hoboken, NJ 07030
E. Voelkl
Affiliation:
High Temperature Materials Laboratory, Oak Ridge National Laboratory, Oak Ridge, TN 37831
B.G. Frost
Affiliation:
Science and Engineering Research Facility, University of Tennessee, Knoxville, TN 37996
Get access

Abstract

This study describes the use of transmission electron holography to determine the mean inner potential of polystyrene. Spherical nanoparticles of amorphous polystyrene are studied so that the effect of specimen thickness on the phase shift of an incident electron wave can be separated from the intrinsic refractive properties of the specimen. A recursive four-parameter χ-squared minimization routine is developed to determine the sphere center, radius, and mean inner potential (Φ0) at each pixel in the phase image. Because of the large number of pixels involved, the statistics associated with determining a single Φ0 value characteristic of a given sphere are quite good. Simulated holograms show that the holographic reconstruction procedure and the χ-squared analysis method are robust. Averaging the Φ0 data derived from ten phase images from ten different polystyrene spheres gives a value of Φ0PS = 8.5 V (σ) = 0.7 V). Specimen charging and electron-beam damage, if present, affect the measurement at a level below the current precision of the experiment.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 4 , Issue 2 , April 1998 , pp. 146 - 157
Copyright
© 2005 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)