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Materials and process discovery by correlated STEM imaging and spectroscopy with electrical testing

Published online by Cambridge University Press:  30 July 2021

Andrew Wagner ,
John Nugent  and
Kumar Virwani
Andrew Wagner
Affiliation:
Intel Corporation, Beaverton, Oregon, United States
John Nugent
Affiliation:
Intel Corporation, United States
Kumar Virwani
Affiliation:
Intel Corporation, United States

Abstract

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Type
Full System and Workflow Automation for Enabling Big Data and Machine Learning in Electron Microscopy
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 2758 - 2761
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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Vasudevan, R., Ziatdinov, M., Vlcek, L. and Kalinin, S., "Off-the-shelf deep learning is not enough, and requires parsimony, Bayesianity, and causality," npj Comput Mater, pp. 7, 16, 2021.Google Scholar