Hostname: page-component-cd9895bd7-dk4vv Total loading time: 0 Render date: 2024-12-25T01:52:34.914Z Has data issue: false hasContentIssue false
  • English
  • Français

Material Sensitive Microscopy on the Nanometer Scale

Published online by Cambridge University Press:  01 August 2005

U Schmidt ,
A Jauss ,
F Vargas ,
M Kress ,
O Hollricher  and
K Weishaupt
U Schmidt
Affiliation:
WITec,Germany
A Jauss
Affiliation:
WITec,Germany
F Vargas
Affiliation:
WITec,Germany
M Kress
Affiliation:
WITec,Germany
O Hollricher
Affiliation:
WITec,Germany
K Weishaupt
Affiliation:
WITec,Germany

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 352 - 353
Copyright
© 2005 Microscopy Society of America