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Mapping metal/insulator nanodomains switching in V2O3 by variable-temperature electron spectromicroscopy investigations

Published online by Cambridge University Press:  30 July 2021

Ibrahim Koita
Affiliation:
Université Paris-Saclay, CNRS, Laboratoire de Physique des Solides, 91405, Orsay, France, United States
Xiaoyan Li
Affiliation:
Université Paris-Saclay, CNRS, Laboratoire de Physique des Solides, 91405, Orsay, France, Ile-de-France, United States
Luiz H. G. Tizei
Affiliation:
Université Paris-Saclay, CNRS, Laboratoire de Physique des Solides, 91405, Orsay, France, France
Jean-Denis Blazit
Affiliation:
Université Paris-Saclay, CNRS, Laboratoire de Physique des Solides, 91405, Orsay, France, United States
Nathalie Brun
Affiliation:
Université Paris-Saclay, CNRS, Laboratoire de Physique des Solides, 91405, Orsay, France, United States
Etienne Janod
Affiliation:
Institut des Matériaux Jean Rouxel (IMN), Université de Nantes, CNRS, 2 Rue de la Houssinière, 44322Nantes, France, United States
Julien Tranchant
Affiliation:
Institut des Matériaux Jean Rouxel (IMN), Université de Nantes, CNRS, 2 Rue de la Houssinière, 44322Nantes, France, United States
Benoît Corraze
Affiliation:
Institut des Matériaux Jean Rouxel (IMN), Université de Nantes, CNRS, 2 Rue de la Houssinière, 44322Nantes, France, United States
Laurent Cario
Affiliation:
Institut des Matériaux Jean Rouxel (IMN), Université de Nantes, CNRS, 2 Rue de la Houssinière, 44322Nantes, France, United States
Marcel Tencé
Affiliation:
Université Paris-Saclay, CNRS, Laboratoire de Physique des Solides, 91405, Orsay, France, ORSAY, France
Odile Stéphan
Affiliation:
Université Paris-Saclay, CNRS, Laboratoire de Physique des Solides, 91405, Orsay, France, United States
Laura Bocher
Affiliation:
Université Paris-Saclay, CNRS, Laboratoire de Physique des Solides, 91405, Orsay, France, United States

Abstract

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Type
Investigating Phase Transitions in Functional Materials and Devices by In Situ/Operando TEM
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

McWhan, D. B., et al. , Phys. Rev. Lett. 1969, 23, 13841387.CrossRefGoogle Scholar
McWhan, D. B., et al. , Phys. Rev. B 1970, 2, 37343750.CrossRefGoogle Scholar
McWhan, D. B., et al. , Phys. Rev. B 1973, 7, 19201931.Google Scholar
Janod, E., et al. , Adv. Funct. Mater. 2015, 25, 62876305.CrossRefGoogle Scholar
Stoliar, P., et al. , Adv. Funct. Mater. 2017, 27, 1604740.Google Scholar
Pergament, A., et al. , Phase Transit. 2012, 85, 185194.CrossRefGoogle Scholar
Lupi, S., et al. , Nat. Commun. 2010, 1, 105.CrossRefGoogle Scholar
Ronchi, A., et al. , Phys. Rev. B 2019, 100, 075111.Google Scholar
McLeod, A. S., et al. , Nat. Phys. 2017, 13, 8086.Google Scholar
Krivanek, O. L., et al. , Nature 2014, 514, 209212.Google Scholar
Goodge, B. H., et al. , Microsc. Microanal. 2020, 26, 439446.Google Scholar
Abe, H., et al. , Jpn. J. Appl. Phys. 1998, 37, 584.CrossRefGoogle Scholar
Torruella, P., et al. , Ultramicroscopy 2018, 185, 4248.CrossRefGoogle Scholar
Teurtrie, A.. Phd thesis, Université Paris Saclay (COmUE) 2019. https://tel.archives-ouvertes.fr/tel-02895558Google Scholar
Van Landuyt, J., et al. , Mater. Res. Bull. 1972, 7, 845856.CrossRefGoogle Scholar
Ayroles, R., et al. , J. Phys. Colloques 1976, 37, C4-101 - C4-104.Google Scholar