Hostname: page-component-586b7cd67f-r5fsc Total loading time: 0 Render date: 2024-12-02T21:21:14.806Z Has data issue: false hasContentIssue false
  • English
  • Français

Mapping Electronic State Changes with STEM EBIC

Published online by Cambridge University Press:  05 August 2019

B. C. Regan ,
Toyanath Joshi ,
Jared J. Lodico ,
Brian T. Zutter ,
Ho Leung Chan ,
Matthew Mecklenburg ,
David Lederman  and
William A. Hubbard
B. C. Regan
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, CA, USA.
Toyanath Joshi
Affiliation:
Department of Physics, University of California, Santa Cruz, CA, USA.
Jared J. Lodico
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, CA, USA.
Brian T. Zutter
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, CA, USA.
Ho Leung Chan
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, CA, USA.
Matthew Mecklenburg
Affiliation:
Core Center of Excellence in Nano Imaging, University of Southern California, Los Angeles, USA.
David Lederman
Affiliation:
Department of Physics, University of California, Santa Cruz, CA, USA.
William A. Hubbard
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, CA, USA.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
In situ TEM Characterization of Dynamic Processes During Materials Synthesis and Processing
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1396 - 1397
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]White, ER et al. , Applied Physics Letters 107 (2015) 223104.Google Scholar
[2]Hubbard, WA et al. , Physical Review Applied 10 (2018) 044066.Google Scholar
[3]Janninck, RF and Whitmore, DH, Journal of Physics and Chemistry of Solids 27 (1966), p. 1183.Google Scholar
[4]Joshi, T et al. , Journal of Physics D: Applied Physics 48 (2015), 335308.Google Scholar
[5]This work was supported by National Science Foundation (NSF) award DMR-1611036, by NSF Science and Technology Center (STC) award DMR-1548924 (STROBE), and by the UCLA PSEIF.Google Scholar