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Making every electron count: materials characterization by quantitative analytical scanning transmission electron microscopy
Published online by Cambridge University Press: 25 July 2016
Abstract
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- Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1430 - 1431
- Copyright
- © Microscopy Society of America 2016
References
[5] The authors wish to thank Ye Zhu (Monash), Nestor Zaluzec (Argonne) and Alan Sandbog (EDAX). This work was supported by the Australian Research Council (Projects DP110102228, DP140102538, DE130100739 and LE0454166) and the Monash Centre for Electron Microscopy.Google Scholar
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