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Magnetic and Crystallographic Microstructure of SrRuO3 Studied by Lorentz Transmission Electron Microscopy

Published online by Cambridge University Press:  02 July 2020

A.F. Marshall ,
L. Klein ,
J.S. Dodge ,
C.H. Ahn ,
J.W. Reiner ,
L. Mieville ,
T.H. Geballe ,
M.R. Beasely  and
A. Kapitulnik
A.F. Marshall
Affiliation:
Center for Materials Research and Applied Physics Dept., Stanford Univeristy, StanfordCA94043
L. Klein
Affiliation:
Center for Materials Research and Applied Physics Dept., Stanford Univeristy, StanfordCA94043
J.S. Dodge
Affiliation:
Center for Materials Research and Applied Physics Dept., Stanford Univeristy, StanfordCA94043
C.H. Ahn
Affiliation:
Center for Materials Research and Applied Physics Dept., Stanford Univeristy, StanfordCA94043
J.W. Reiner
Affiliation:
Center for Materials Research and Applied Physics Dept., Stanford Univeristy, StanfordCA94043
L. Mieville
Affiliation:
Center for Materials Research and Applied Physics Dept., Stanford Univeristy, StanfordCA94043
T.H. Geballe
Affiliation:
Center for Materials Research and Applied Physics Dept., Stanford Univeristy, StanfordCA94043
M.R. Beasely
Affiliation:
Center for Materials Research and Applied Physics Dept., Stanford Univeristy, StanfordCA94043
A. Kapitulnik
Affiliation:
Center for Materials Research and Applied Physics Dept., Stanford Univeristy, StanfordCA94043
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SrRuO3 is a low temperature ferromagnet (Tc ≌ 150K) which has recently been investigated in thin film form due to its structural compatibility with other thin film perovskites materials of practical interest, including high-temperature superconductors. Magnetization studies of thin films of SrRuO3 deposited on cubic SrTiO3 indicate strong uniaxial anisotropy with the easy direction approximately along either the a or b axis, which are difficult to distinguish. The orthorhombic structure of SrRuO3 (a = 5.53, b = 5.57, c = 7.84 Å) has six symmetry-related orientations on the cubic substrate (a = 3.9Å). Using Lorentz transmission electron microscopy both the magnetic and the crystallographic domain microstructure are characterized.

For TEM imaging the films are readily removed from the substrate by chemical etching, using a HF:HNO3:H2O etch of approximately 1:1:1 dilution. Free-floating SrRuO3 films of 300-1000Å in thickness are then supported on standard carbon/formvar films on Cu substrates.

Type
Recent Developments in Microscopy for Studying Electronic and Magnetic Materials
Information
Microscopy and Microanalysis , Volume 3 , Issue S2: Proceedings: Microscopy & Microanalysis '97, Microscopy Society of America 55th Annual Meeting, Microbeam Analysis Society 31st Annual Meeting, Histochemical Society 48th Annual Meeting, Cleveland, Ohio, August 10-14, 1997 , August 1997 , pp. 521 - 522
Copyright
Copyright © Microscopy Society of America 1997

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References

1. Klein, L., et al., Appl. Phys. Lett. 66(1995)2427, and ref. therein.CrossRefGoogle Scholar

2. Klein, L., et al., Phys. Rev. Lett. 77 (1996) 2774.CrossRefGoogle Scholar

3. This work was supported by the NSF-MRSEC program through the Center for Materials Research at Stanford University.Google Scholar