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Low-kV SEM Imaging of Epitaxial Graphene Grown on Various Substrates

Published online by Cambridge University Press:  27 August 2014

Iwona Jozwik-Biala
Affiliation:
Institute of Electronic Materials Technology, Wolczynska 133, 01-919 Warsaw, Poland
Kacper Gródecki
Affiliation:
Institute of Electronic Materials Technology, Wolczynska 133, 01-919 Warsaw, Poland Faculty of Physics, University of Warsaw, Hoza 69, 00-681Warsaw, Poland
Jacek Baranowski
Affiliation:
Institute of Electronic Materials Technology, Wolczynska 133, 01-919 Warsaw, Poland
Włodzimierz Strupinski
Affiliation:
Institute of Electronic Materials Technology, Wolczynska 133, 01-919 Warsaw, Poland
Iwona Pasternak
Affiliation:
Institute of Electronic Materials Technology, Wolczynska 133, 01-919 Warsaw, Poland
Aleksandra Krajewska
Affiliation:
Institute of Electronic Materials Technology, Wolczynska 133, 01-919 Warsaw, Poland Institute of Optoelectronics, Military University of Technology, Gen. S. Kaliskiego 2, 00-908 Warsaw, Poland

Abstract

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Type
Abstract
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Mattausch, A and Pankratov, O Physical Review Letters 99 (2007) p.076802.Google Scholar
[2] Jaksch, H Proceedings of the Workshop of European Microbeam Analysis Society (2011) p.255.Google Scholar