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Low Vacuum Scanning Electron Microscopy, a Novel Technique for Integrated Microscopic Evaluation of Implantable Devices

Published online by Cambridge University Press:  06 August 2003

F. J. Clubb, Jr ,
M. R. Coscio ,
R. Nichols ,
A. Rossi ,
L. Stagnoli ,
S. Sedlik ,
E. Koullick ,
M. Bergan ,
E. Fogt  and
M. Petersen
...Show all authors
F. J. Clubb, Jr
Affiliation:
Department of Cardiovascular Pathology, Texas Heart Institute, Houston, TX 77225
M. R. Coscio
Affiliation:
Materials and Biosciences Center, Medtronic, Minneapolis, MN 55432
R. Nichols
Affiliation:
Department of Cardiovascular Pathology, Texas Heart Institute, Houston, TX 77225
A. Rossi
Affiliation:
AVE, Medtronic, Santa Rosa, CA 95403
L. Stagnoli
Affiliation:
AVE, Medtronic, Santa Rosa, CA 95403
S. Sedlik
Affiliation:
AVE, Medtronic, Santa Rosa, CA 95403
E. Koullick
Affiliation:
Materials and Biosciences Center, Medtronic, Minneapolis, MN 55432
M. Bergan
Affiliation:
Materials and Biosciences Center, Medtronic, Minneapolis, MN 55432
E. Fogt
Affiliation:
Materials and Biosciences Center, Medtronic, Minneapolis, MN 55432
M. Petersen
Affiliation:
Physiological Research Laboratories, Medtronic, Minneapolis, MN 55448
C. B. McClay
Affiliation:
Physiological Research Laboratories, Medtronic, Minneapolis, MN 55448

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 208 - 209
Copyright
Copyright © Microscopy Society of America 2003