Hostname: page-component-cd9895bd7-gvvz8 Total loading time: 0 Render date: 2024-12-31T23:18:25.214Z Has data issue: false hasContentIssue false
  • English
  • Français

Low Energy MeV Ion Beams, Microscopy and Non-Destructive Surface Analysis of Materials

Published online by Cambridge University Press:  31 July 2015

J. Pacheco de Carvalho ,
C. F. R. Pacheco  and
A. D. Reis
J. Pacheco de Carvalho
Affiliation:
Departamento de Física, Universidade da Beira Interior, Rua Marquês d’Ávila e Bolama, 6201-001 Covilhã, Portugal Unidade de Detecção Remota, Universidade da Beira Interior, Rua Marquês d’Ávila e Bolama, 6201-001 Covilhã, Portugal
C. F. R. Pacheco
Affiliation:
Unidade de Detecção Remota, Universidade da Beira Interior, Rua Marquês d’Ávila e Bolama, 6201-001 Covilhã, Portugal
A. D. Reis
Affiliation:
Departamento de Física, Universidade da Beira Interior, Rua Marquês d’Ávila e Bolama, 6201-001 Covilhã, Portugal Unidade de Detecção Remota, Universidade da Beira Interior, Rua Marquês d’Ávila e Bolama, 6201-001 Covilhã, Portugal
Get access

Abstract

An abstract is not available for this content so a preview has been provided. Please use the Get access link above for information on how to access this content.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Materials Science
Information
Microscopy and Microanalysis , Volume 21 , Issue S5: INCOMAM'14 International Conference on Microscopy and Microanalysis , August 2015 , pp. 19 - 20
Copyright
© Microscopy Society of America 2015

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1]Tesmer, J. R. & Nastasi, M. (Eds.), Handbook of Modern Ion Beam Materials Analysis. Materials Research Society, Pittsburgh, PA, 1995.Google Scholar
[2]Amsel, G. & Battistig, G., Nucl. Instr. and Meth. B 240, 2005). pp. 1–12.10.1016/j.nimb.2005.06.078Google Scholar
[3]Calvert, J. M., et al.., J. Phys. D: Appl. Phys 7, 1974). pp. 940–953.10.1088/0022-3727/7/7/303Google Scholar
[4]Pacheco de Carvalho, J. A. R. & Reis, A. D., Bol. Soc. Esp. Ceram 47(4, 2008). pp. 252–257.10.3989/cyv.2008.v47.i4.186Google Scholar
[5]Pacheco de Carvalho, J. A. R., et al., Nucl. Instr. and Meth. B 269(24, 2011). pp. 3054–3056.10.1016/j.nimb.2011.04.079Google Scholar
[6]Pacheco de Carvalho, J., et al., Microsc. Microanal 19(S4, 2013). pp. 133–134.10.1017/S1431927613001281Google Scholar
[7]Barradas, N.P., et al., Nucl. Instr. and Meth. B 262, 2007). pp. 281–303.10.1016/j.nimb.2007.05.018Google Scholar
[8] Supports from Universidade da Beira Interior and FCT (Fundação para a Ciência e a Tecnologia) PEst-OE-FIS/UI0524/2014 (Projeto Estratégico-UI524-2014) are acknowledged.Google Scholar