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Low angle ADF STEM defect imaging

Published online by Cambridge University Press:  23 November 2012

P. Phillips ,
M. De Graef ,
L. Kovarik ,
A. Agrawal ,
W. Windl  and
M. Mills
P. Phillips
Affiliation:
University of Illinois at Chicago, Chicago, IL
M. De Graef
Affiliation:
Carnegie Mellon University, Pittsburgh, PA
L. Kovarik
Affiliation:
PNNL, Richland, WA
A. Agrawal
Affiliation:
Ohio State University, Columbus, OH
W. Windl
Affiliation:
Ohio State University, Columbus, OH
M. Mills
Affiliation:
Ohio State University, Columbus, OH
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 676 - 677
Copyright
Copyright © Microscopy Society of America 2012

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