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Lorentz TEM Characterization of Al-Cu-Ge-Mn Alloys

Published online by Cambridge University Press:  01 August 2005

J P Winer ,
N T Nuhfer ,
M E McHenry  and
M De Graef
J P Winer
Affiliation:
Carnegie Mellon University
N T Nuhfer
Affiliation:
Carnegie Mellon University
M E McHenry
Affiliation:
Carnegie Mellon University
M De Graef
Affiliation:
Carnegie Mellon University

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 1808 - 1809
Copyright
© 2005 Microscopy Society of America