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Local Crystallography: Phases, Symmetries, and Defects from Bottom Up

Published online by Cambridge University Press:  23 September 2015

Alex Belianinov
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN37831. 2.The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN
He
Affiliation:
3.Materials Sciences and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN
Mikhail Kravchenko
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN37831. 2.The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN
Jesse
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN37831. 2.The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN
Albina Borisevich
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN37831. 3.Materials Sciences and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN
Sergei V. Kalinin
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN37831. 2.The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN

Abstract

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Type
Abstract
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Shiju, N. R. and Guliants, V. V. Recent developments in catalysis using nanostructured materials. Applied Catalysis A: General 356, 1-, doi:10.1016/j.apcata.2008.11.034 (2009).CrossRefGoogle Scholar
[2] Xiahan Sang, Adedapo A., Oni, , and LeBeau, James M., Atom Column Indexing: Atomic Resolution Image Analysis Through a Matrix Representation, Microsc. Microanal., (doi:10.1017/S1431927614013506.CrossRefGoogle Scholar
[3] Sarahan, M.C., Chi, M., Masiel, D.J. and Browning, N.; Point defect characterization in HAADF-STEM images using multivariate statistical analysis. Ultramicroscopy 111 (3, pp. 251257; 2011.CrossRefGoogle ScholarPubMed
[4] Jones, L. and Nellist, P.D., Identifying and correcting scan noise and drift in the scanning transmission electron microscope (2013). Microscopy and Microanalysis 19 (4), pp. 10501060.CrossRefGoogle ScholarPubMed
[5] Research for all authors was supported by the US Department of Energy, Basic Energy Sciences, Materials Sciences and Engineering Division. This research was conducted at the Center for Nanophase Materials Sciences, which is sponsored at Oak Ridge National Laboratory by the Scientific User Facilities Division, Office of Basic Energy Sciences, U. S. Department of Energy..Google Scholar