Hostname: page-component-586b7cd67f-t8hqh Total loading time: 0 Render date: 2024-11-26T14:33:13.785Z Has data issue: false hasContentIssue false
  • English
  • Français

Layer-number-dependent Optical and Electrical Properties of Graphene on ZnO

Published online by Cambridge University Press:  10 August 2018

Yi-Hang Ku ,
Lo-Yueh Chang ,
Hung-Wei Shiu ,
Yen-Chien Kuo ,
Shangjr Gwo ,
Chi-Liang Chen  and
Chia-Hao Chen
Yi-Hang Ku
Affiliation:
National Synchrotron Radiation Research Center, Hsinchu, 30076, Taiwan Department of Physics, National Tsing-Hua University, Hsinchu, 30013, Taiwan
Lo-Yueh Chang
Affiliation:
National Synchrotron Radiation Research Center, Hsinchu, 30076, Taiwan
Hung-Wei Shiu
Affiliation:
National Synchrotron Radiation Research Center, Hsinchu, 30076, Taiwan
Yen-Chien Kuo
Affiliation:
National Synchrotron Radiation Research Center, Hsinchu, 30076, Taiwan
Shangjr Gwo
Affiliation:
National Synchrotron Radiation Research Center, Hsinchu, 30076, Taiwan Department of Physics, National Tsing-Hua University, Hsinchu, 30013, Taiwan
Chi-Liang Chen
Affiliation:
National Synchrotron Radiation Research Center, Hsinchu, 30076, Taiwan
Chia-Hao Chen*
Affiliation:
National Synchrotron Radiation Research Center, Hsinchu, 30076, Taiwan
*
* Corresponding authors, [email protected] (CLC) and [email protected] (CHC)

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 492 - 493
Copyright
© Microscopy Society of America 2018 

References

[1] Tung, R. T. Phys. Rev. B 45, 13509 1992.Google Scholar
[2] Brillson, L. J. Lu, Y. J. App. Phys. 109, 121301 2011.Google Scholar
[3] Sharma, B. L. Metal-Semiconductor Schottky Barrier Junctions and Their Applications. Springer-Verlag New York Inc. 2012.Google Scholar
[4] Mueller, T., Xia, F. Avouris, P. Nature Photonics 4, 297 2010.CrossRefGoogle Scholar
[5] Hwang, S. W., et al, Phys. Rev. Lett. 105, 127403 2010.Google Scholar
[6] Hwang, E. H., et al, Phys. Rev. Lett. 98, 186806 2007.Google Scholar
[7] Shiu, H. W., et al, App. Phys. Lett. 103, 081604 2013.Google Scholar
[8] Shiu, H. W., et al, J. App. Phys. 113, 043701 2013.Google Scholar
[9] The authors thank the NSRRC beamline staff for their skillful assistance during the experiments. This work was partially financial supported by the Ministry of Science and Technology of Taiwan.Google Scholar