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Lattice Fringe observations in a Field Emission SEM

Published online by Cambridge University Press:  05 August 2007

VV Ngo ,
M Hernandez ,
B Roth  and
D Joy
VV Ngo
Affiliation:
Hitachi High Technologies America
M Hernandez
Affiliation:
Hitachi High Technologies America
B Roth
Affiliation:
Hitachi High Technologies America
D Joy
Affiliation:
University of Tennessee
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 888 - 889
Copyright
© 2007 Microscopy Society of America

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