Hostname: page-component-78c5997874-g7gxr Total loading time: 0 Render date: 2024-11-19T13:44:05.372Z Has data issue: false hasContentIssue false
  • English
  • Français

Large Solid Angle 50 mm2 SDD for TEM Applications

Published online by Cambridge University Press:  01 August 2010

S Barkan ,
VD Saveliev ,
NJ Zaluzec ,
CR Tull ,
L Feng  and
M Takahashi
S Barkan
Affiliation:
SII NanoTechnology USA Inc.
VD Saveliev
Affiliation:
SII NanoTechnology USA Inc.
NJ Zaluzec
Affiliation:
Argonne National Laboratory
CR Tull
Affiliation:
SII NanoTechnology USA Inc.
L Feng
Affiliation:
SII NanoTechnology USA Inc.
M Takahashi
Affiliation:
SII NanoTechnology USA Inc.

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1316 - 1317
Copyright
Copyright © Microscopy Society of America 2010