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Joy of Scanning with Electron and X-ray Imaging

Published online by Cambridge University Press:  01 August 2018

Philippe T. Pinard ,
Simon Burgess ,
Anthony Hyde ,
James Holland  and
Peter Statham
Philippe T. Pinard
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, UK.
Simon Burgess
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, UK.
Anthony Hyde
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, UK.
James Holland
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, UK.
Peter Statham
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, UK.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 624 - 625
Copyright
© Microscopy Society of America 2018 

References

[1] Statham, P, et al, Microsc. Microanal. 19(S2 2013) p. 752.Google Scholar
[2] Statham, P Microsc. Microanal. 19(S2 2013) p. 1292.Google Scholar