Hostname: page-component-586b7cd67f-gb8f7 Total loading time: 0 Render date: 2024-11-27T14:18:56.596Z Has data issue: false hasContentIssue false
  • English
  • Français

Is dielectrophoresis effective for increasing local concentration of particles in liquid-cell transmission electron microscopy?

Published online by Cambridge University Press:  22 July 2022

Tomoya Yamazaki ,
Hiromasa Niinomi ,
Hiroyasu Katsuno ,
Hooman Hosseinkhannazer ,
Eric Daigle  and
Yuki Kimura
Tomoya Yamazaki*
Affiliation:
Institute of Low Temperature Science, Hokkaido University, Sapporo, Hokkaido, Japan
Hiromasa Niinomi
Affiliation:
Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai, Miyagi, Japan
Hiroyasu Katsuno
Affiliation:
Institute of Low Temperature Science, Hokkaido University, Sapporo, Hokkaido, Japan
Hooman Hosseinkhannazer
Affiliation:
Norcada Inc., Edmonton, AB, Canada
Eric Daigle
Affiliation:
Norcada Inc., Edmonton, AB, Canada
Yuki Kimura
Affiliation:
Institute of Low Temperature Science, Hokkaido University, Sapporo, Hokkaido, Japan
*
*Corresponding author: [email protected]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
On Demand - In Situ TEM Characterization of Dynamic Processes During Materials Synthesis And Processing
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 1934 - 1936
Check for updates
Copyright
Copyright © Microscopy Society of America 2022

References

Nielsen, MH, Aloni, S and De Yoreo, JJ, Science 345 (2014), p. 1158. doi:10.1126/science.1254051CrossRefGoogle Scholar
Yamazaki, T et al. , Proc. Natl. Acad. Sci. USA 114 (2017), p. 2154. doi:10.1073/pnas.1606948114CrossRefGoogle Scholar
Woehl, TJ et al. , ACS Nano 6 (2012), p. 8599. doi:10.1021/nn303371yCrossRefGoogle Scholar
Yuk, JM et al. , ACS Nano 10 (2016), p. 88. doi:10.1021/acsnano.5b04064CrossRefGoogle Scholar
Yamazaki, T and kimura, Y, Microsc. Microanal. 27 (2021), p. 459. doi:10.1017/S1431927621000179CrossRefGoogle Scholar
Pohl, HA, J. Appl. Phys. 22 (1951), p. 869. doi:10.1063/1.1700065CrossRefGoogle Scholar
Hölzel, R et al. , Phys. Rev. Lett. 95 (2005), p. 128102. doi: 10.1103/PhysRevLett.95.128102CrossRefGoogle Scholar
Leenheer, AJ et al. , J. Microelectromechanical Syst. 24 (2015), p. 1061. doi:10.1109/JMEMS.2014.2380771CrossRefGoogle Scholar
This work was supported by the GIMRT Program of the Institute for Materials Research, Tohoku University (Proposal No. 20K0038) and by JSPS KAKENHI (grants numbers JP20H02580 and JP20H05657). Mr. S Mori is thanked for his technical assistance.Google Scholar