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Ionic Liquid Used for Charge Compensation for High-Resolution Imaging and Analysis in the FE-SEM

Published online by Cambridge University Press:  27 August 2014

Nicolas Brodusch ,
Hendrix Demers  and
Raynald Gauvin
Nicolas Brodusch
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada
Hendrix Demers
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada
Raynald Gauvin
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 38 - 39
Copyright
Copyright © Microscopy Society of America 2014 

References

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