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Investigation of Ordered-Vacancy Structures in Ga2(Se0.33Te0.67)3 Semiconductors via High-Resolution Electron Microscopy

Published online by Cambridge University Press:  23 November 2012

N. Abdul-Jabbar ,
M. Boese ,
E. Bourret-Courchesne  and
B. Wirth
N. Abdul-Jabbar
Affiliation:
Nuclear Engineering, University of California, Berkeley, CA
M. Boese
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, CA
E. Bourret-Courchesne
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, CA
B. Wirth
Affiliation:
University of Tennessee, Knoxville, TN
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 370 - 371
Copyright
Copyright © Microscopy Society of America 2012

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