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Investigation of Grain Boundary Structure and Composition of Bismuth Embrittled Copper Bicrystals with Aberration-Corrected Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  23 November 2012

C. Wade ,
M. McLean ,
R. Vinci ,
M. Watanabe  and
L. Giannuzzi
C. Wade
Affiliation:
Lehigh University, Bethlehem, PA
M. McLean
Affiliation:
Lehigh University, Bethlehem, PA
R. Vinci
Affiliation:
Lehigh University, Bethlehem, PA
M. Watanabe
Affiliation:
Lehigh University, Bethlehem, PA
L. Giannuzzi
Affiliation:
L. A. Giannuzzi & Associates LLC, Fort Myers, FL
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 346 - 347
Copyright
Copyright © Microscopy Society of America 2012

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