Investigation of Diffraction Condition and Convergent Probe Effects on Inelastic Mean Free Path Determination by Using a Cone-Shaped Silicon Crystal

Q Jin; S Wang

doi:10.1017/S1431927606061782

Investigation of Diffraction Condition and Convergent Probe Effects on Inelastic Mean Free Path Determination by Using a Cone-Shaped Silicon Crystal

Published online by Cambridge University Press: 31 July 2006

Q Jin and

S Wang

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Q Jin: Affiliation:
Micron Technology,Inc
S Wang: Affiliation:
Micron Technology,Inc

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Type: Abstract
Information: Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1184 - 1185

DOI: https://doi.org/10.1017/S1431927606061782 [Opens in a new window]

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Investigation of Diffraction Condition and Convergent Probe Effects on Inelastic Mean Free Path Determination by Using a Cone-Shaped Silicon Crystal

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