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Investigating the Causes of Electrostatic Charging of Phase-contrast Apertures

Published online by Cambridge University Press:  27 August 2014

Robert M. Glaeser
Robert M. Glaeser*
Affiliation:
Life Sciences Division, Lawrence Berkeley National Laboratory, University of California, Berkeley, CA, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 210 - 211
Copyright
Copyright © Microscopy Society of America 2014 

References

Glaeser, RM Review of Scientific Instruments 84 (2013), 111101.Google Scholar
Glaeser, RM, et al., Ultramicroscopy 135 (2013),6.Google Scholar
Banhardt, , et al. Chem. Phys. Lett. 269 (1997),349.Google Scholar
This work was supported in part by NIH grant GMS083039. Collaborators include B. Buijsse, S. Cabrini, R. Csencsits, R. Danev, KH Downing, DM Larson, BG Han, J. Jin, and S. Sassolini.Google Scholar