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Investigating Ferroelectric Domain and Domain Wall Dynamics at Atomic Resolution by TEM/STEM in situ Heating and Biasing

Published online by Cambridge University Press:  05 August 2019

Michele Conroy ,
Kalani Moore ,
Eoghan O'Connell ,
Eileen Courtney ,
Alan Harvey ,
Charlotte Cochard ,
Joseph Guy ,
Raymond McQuaid ,
Lewys Jones  and
Clive Downing
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Michele Conroy*
Affiliation:
TEMUL, Department of Physics, School of Natural Sciences & Bernal Institute, University of Limerick,Limerick, Ireland.
Kalani Moore
Affiliation:
TEMUL, Department of Physics, School of Natural Sciences & Bernal Institute, University of Limerick,Limerick, Ireland.
Eoghan O'Connell
Affiliation:
TEMUL, Department of Physics, School of Natural Sciences & Bernal Institute, University of Limerick,Limerick, Ireland.
Eileen Courtney
Affiliation:
TEMUL, Department of Physics, School of Natural Sciences & Bernal Institute, University of Limerick,Limerick, Ireland.
Alan Harvey
Affiliation:
TEMUL, Department of Physics, School of Natural Sciences & Bernal Institute, University of Limerick,Limerick, Ireland.
Charlotte Cochard
Affiliation:
Department of Mathematics and Physics, Queen's University, University Rd., Belfast, UK.
Joseph Guy
Affiliation:
Department of Mathematics and Physics, Queen's University, University Rd., Belfast, UK.
Raymond McQuaid
Affiliation:
Department of Mathematics and Physics, Queen's University, University Rd., Belfast, UK.
Lewys Jones
Affiliation:
Advanced Microscopy Laboratory, Trinity College Dublin, Dublin, Ireland.
Clive Downing
Affiliation:
Advanced Microscopy Laboratory, Trinity College Dublin, Dublin, Ireland.
Roger Whatmore
Affiliation:
Department of Materials, Imperial College London, Exhibition Road, London, UK.
Marty Gregg
Affiliation:
Department of Mathematics and Physics, Queen's University, University Rd., Belfast, UK.
Ursel Bangert
Affiliation:
TEMUL, Department of Physics, School of Natural Sciences & Bernal Institute, University of Limerick,Limerick, Ireland.
*
*Corresponding author: [email protected]

Abstract

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Type
In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1882 - 1883
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]McQuaid, R et al. , Nature Communications 8 (2017).Google Scholar
[2]Jiang, J et al. , Nature Materials 17 (17) (2017), p. 49.Google Scholar
[3]McGilly, LJ et al. , Nature Nanotechnology 10 (2015), p. 145.Google Scholar
[4]Seidel, J et al. , J. Phys. Chem. Lett 19 (2012), p. 2905.Google Scholar
[5]Catalan, G et al. , Domain Wall Nanoelectronics. Rev. Mod. Phys 84 (2012), p. 119.Google Scholar
[6]Farokhipoor, S et al. , Nature 515 (2014), p. 379.Google Scholar
[7]Nord, M et al. , Adv Struct Chem Imaging 3 (2017) p. 9.Google Scholar
[8]The authors acknowledge funding from SFI US-Ireland fund.Google Scholar