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Introduction to Sophisticated Instrumentation in Education Through the Use of a Scanning Electron Microscope Simulator

Published online by Cambridge University Press:  01 August 2002

G. Casuccio ,
H. Lentz ,
S. Kennedy ,
C. Staun ,
J. Lang ,
S. Chumbley ,
C. Hargrave  and
T. Nolan
G. Casuccio
Affiliation:
RJ Lee Group, Inc, 350 Hochberg Road, Monroeville, PA, 15146
H. Lentz
Affiliation:
RJ Lee Group, Inc, 350 Hochberg Road, Monroeville, PA, 15146
S. Kennedy
Affiliation:
RJ Lee Group, Inc, 350 Hochberg Road, Monroeville, PA, 15146
C. Staun
Affiliation:
West Greene School District, RD#5 Box 36-A, Waynesburg, PA 15370
J. Lang
Affiliation:
West Greene School District, RD#5 Box 36-A, Waynesburg, PA 15370
S. Chumbley
Affiliation:
Materials Science and Engineering , and Curriculum & Instructional Technology, Iowa State University, Ames, IA 50011
C. Hargrave
Affiliation:
Materials Science and Engineering , and Curriculum & Instructional Technology, Iowa State University, Ames, IA 50011
T. Nolan
Affiliation:
Oak Ridge National Laboratory, PO Box 2008, Oak Ridge, TN 37831-6064

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 1564 - 1565
Copyright
Copyright © Microscopy Society of America 2002