Hostname: page-component-cd9895bd7-gxg78 Total loading time: 0 Render date: 2024-12-28T03:22:19.467Z Has data issue: false hasContentIssue false
  • English
  • Français

Introduction: Electron Backscatter Diffraction Special Section

Published online by Cambridge University Press:  24 June 2013

Andrew Deal
Andrew Deal*
Affiliation:
Organizing Committee Chair, EBSD 2012 Committee Member, EBSD 2014 Co-Guest Editor, Microscopy and Microanalysis
Get access

Extract

Welcome to the second special section of Microscopy and Microanalysis focused on electron backscatter diffraction (EBSD), which follows the June 2011 issue. The content of the previous special section was provided by participants at EBSD 2010, the second Microanalysis Society (MAS) topical conference dedicated to EBSD in the United States. The present 2013 special section includes work from participants at both EBSD 2012, the third of such topical conferences (held June 19–21, 2012 at Carnegie Mellon University, Pittsburgh, PA), and EMAS 2012, the European Microanalysis Society's 10th Regional Workshop that included three EBSD sessions (held June 17–20 at the Institute for Geosciences and Earth Resources, Padua, Italy).

Type
EBSD Special Section: U.S. EBSD Special Section--Introduction
Information
Microscopy and Microanalysis , Volume 19 , Issue 4 , August 2013 , pp. 920
Copyright
Copyright © Microscopy Society of America 2013 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)