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Interplay between structural and electronic properties with the metal-insulator transition in NdNiO3 thin films

Published online by Cambridge University Press:  30 July 2021

Y. Eren Suyolcu ,
Katrin Fürsich ,
Matthias Hepting ,
Zhicheng Zhong ,
Yi Lu ,
Yi Wang ,
Georg Christiani ,
Gennady Logvenov ,
Philipp Hansmann  and
Matteo Minola
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Y. Eren Suyolcu
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY, USA, New York, United States
Katrin Fürsich
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Germany, United States
Matthias Hepting
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Germany, United States
Zhicheng Zhong
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Germany, United States
Yi Lu
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Germany, United States
Yi Wang
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Germany, Germany
Georg Christiani
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Germany, United States
Gennady Logvenov
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Germany, United States
Philipp Hansmann
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Germany, United States
Matteo Minola
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Germany, United States
Bernhard Keimer
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Germany, Baden-Wurttemberg, Germany
Peter A. van Aken
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Germany, Germany
Eva Benckiser
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Germany, Germany

Abstract

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Type
Quantum Materials Probed by High Spatial and Energy Resolution in Scanning/Transmission Electron Microscopy
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 144 - 145
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Suyolcu, Y. E. et al. , J. Supercond. Nov. Magn. 33 (2020), p. 107.CrossRefGoogle Scholar
Middey, S., et al. , Annu. Rev. Mater. Res. 46 (2016), p. 305.CrossRefGoogle Scholar
Catalano, S., et al. APL Mater. 3 (2015), p. 062506.Google Scholar
Wang, Y., et al. , Ultramicroscopy 168 (2016), p. 46.CrossRefGoogle Scholar
Hepting, M., et al. , Nat. Phys. 14 (2018), p 1097.CrossRefGoogle Scholar
Suyolcu, Y. E. et al. , arXiv:2102.05415 (2021).Google Scholar