Hostname: page-component-586b7cd67f-gb8f7 Total loading time: 0 Render date: 2024-11-29T13:07:03.699Z Has data issue: false hasContentIssue false
  • English
  • Français

Interfacial Atomic Number Contrast in Thick Samples

Published online by Cambridge University Press:  27 August 2014

Aniruddha Dutta  and
Helge Heinrich
Aniruddha Dutta
Affiliation:
Advanced Material Processing & Analysis Center (AMPAC), Department of Physics, Department of Physics, University of Central Florida, Orlando, FL, USA
Helge Heinrich
Affiliation:
Advanced Material Processing & Analysis Center (AMPAC), Department of Physics, Department of Physics, University of Central Florida, Orlando, FL, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 136 - 137
Copyright
Copyright © Microscopy Society of America 2014 

References

References:

[1] Doyle, P., Turner, P. Acta Crystallographica A24 (1968), 390-397.Google Scholar
[2] Dutta, A., et.al, Microscopy & Microanalysis 19 (S2), 852-853.Google Scholar
[3] Dutta, A., et.al, Journal of Microscopy 251 (1) (2013), 27-34.Google Scholar
[4] Peng, L., et.al, Acta Crystallographica A52 (1996), 257-76.Google Scholar
[5] Peng, L., et.al, Acta Crystallographica A52 (1996), 456-470.Google Scholar