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Interfaces and Extended Structural Defects in Chalcopyrite Thin-Film Solar Cells Studied by Transmission Electron Microscopy

Published online by Cambridge University Press:  27 August 2014

S. S. Schmidt ,
J. Dietrich ,
C. T. Koch ,
B. Schaffer ,
M. Schaffer ,
M. Klingsporn ,
S. Merdes  and
D. Abou-Ras
S. S. Schmidt
Affiliation:
Helmholtz-Zentrum Berlin für Materialien und Energie, Berlin, Germany
J. Dietrich
Affiliation:
Helmholtz-Zentrum Berlin für Materialien und Energie, Berlin, Germany
C. T. Koch
Affiliation:
Ulm University, Institute for Experimental Physics, Ulm, Germany
B. Schaffer
Affiliation:
SuperSTEM, STFC Daresbury Laboratories, Warrington, United Kingdom
M. Schaffer
Affiliation:
SuperSTEM, STFC Daresbury Laboratories, Warrington, United Kingdom
M. Klingsporn
Affiliation:
Leibniz-Institut für innovative Mikroelektronik, Technology, Frankfurt Oder, Germany
S. Merdes
Affiliation:
Helmholtz-Zentrum Berlin für Materialien und Energie, Berlin, Germany
D. Abou-Ras
Affiliation:
Helmholtz-Zentrum Berlin für Materialien und Energie, Berlin, Germany

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 530 - 531
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Dietrich, J., et al, IEEE Journal of Photovoltaics 2 (2012), p. 364.Google Scholar
[2] Press release: http://www.zsw-bw.de/uploads/media/pi18-2013-ZSW-WorldrecordCIGS.pdf.Google Scholar
[3] Abou-Ras, D., et al, Adv. Energy Mater. 2 (2012), p. 992.Google Scholar
[4] Schmidt, S. S. Ph.D. thesis, TU Berlin (2011).Google Scholar
[5] Schmidt, S. S., et al, Phys. Rev. Lett. 109 (2012), p. 095506.Google Scholar
[6] Dietrich, J. Ph.D. thesis, TU Berlin (2013).Google Scholar