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Interface Structure-Property Relations Through Aberration-Corrected STEM

Published online by Cambridge University Press:  01 August 2010

SJ Pennycook ,
AY Borisevich ,
M Varela ,
AR Lupini ,
HJ Chang ,
DN Leonard ,
TJ Pennycook ,
MP Oxley ,
JC Idrobo  and
H Yurdakul
...Show all authors
SJ Pennycook
Affiliation:
Oak Ridge National Laboratory
AY Borisevich
Affiliation:
Oak Ridge National Laboratory
M Varela
Affiliation:
Oak Ridge National Laboratory
AR Lupini
Affiliation:
Oak Ridge National Laboratory
HJ Chang
Affiliation:
Oak Ridge National Laboratory
DN Leonard
Affiliation:
Oak Ridge National Laboratory
TJ Pennycook
Affiliation:
Oak Ridge National Laboratory
MP Oxley
Affiliation:
Vanderbilt University
JC Idrobo
Affiliation:
Oak Ridge National Laboratory
H Yurdakul
Affiliation:
Oak Ridge National Laboratory
S Turan
Affiliation:
Anadolu University, Turkey
P Yu
Affiliation:
University of California, Berkeley
R Ramesh
Affiliation:
University of California, Berkeley
ST Pantelides
Affiliation:
Vanderbilt University

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1420 - 1421
Copyright
Copyright © Microscopy Society of America 2010